SANBlaze Technology, Inc. is a pioneer in storage emulation technologies and a leading provider of storage, networking and multifunction solutions for embedded computing.

Sanblaze NVMe Testing

NVM Express – Native

The VirtuaLUN provides full control and programmability of NVMe parameters, providing unique storage test conditions for NVMe drive testing, development and certification. Additional support for updating and loading firmware, as well as support for secure erase, provides support for further automation steps and processes. Initiator emulation delivers the ability to drive multiple channels of traffic, inject errors, and send specific or custom op codes in an easy to use, scriptable platform. Features such as Read/Write/Compare testing, error injection and a custom command builder provide an environment to drive and test single or multiple NVMe target devices.

NVMe-oF™ Testing

The VirtuaLUN provides full control and programmability of NVMe-oF parameters, providing unique storage test conditions for testing and development. Easily configurable target environments with optional storage profiles can be edited and saved for reuse. Multiple error conditions and triggers allow for complex error injection. RAM based targets provide low latency targets for performance testing. Very complex error conditions can be simulated to provide a unique platform for backplane and controller testing.

FC-NVMe Testing

SANBlaze VirtuaLUN storage emulation for FC-NVMe is the key piece of test equipment for anyone developing products supporting the FC-NVMe storage protocol. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation and test and QA. The ability to emulate FC-NVMe targets and initiators concurrently with native FC targets and initiators on the same wire with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real SAN environments and test director class switch environments at a fraction of the cost of real devices.p>